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From Contamination to Defects, Faults and Yield Loss von Wojciech Maly (1996, Gebundene Ausgabe)

About this product

Produktinformation

Over the years there has been a large increase in the functionality available on a single integrated circuit. This has been mainly achieved by a continuous drive towards smaller feature sizes, larger dies, and better packing efficiency. However, this greater functionality has also resulted in substantial increases in the capital investment needed to build fabrication facilities. Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield. Modern VLSI research and engineering (which includes design manufacturing and testing) encompasses a very broad range of disciplines such as chemistry, physics, material science, circuit design, mathematics and computer science. Due to this diversity, the VLSI arena has become fractured into a number of separate sub-domains with little or no interaction between them. This is the case with the relationships between testing and manufacturing. From Contamination to Defects, Faults and Yield Loss: Simulation and Applications focuses on the core of the interface between manufacturing and testing, i.e., the contamination-defect-fault relationship. The understanding of this relationship can lead to better solutions of many manufacturing and testing problems. Failure mechanism models are developed and presented which can be used to accurately estimate probability of different failures for a given IC. This information is critical in solving key yield-related applications such as failure analysis, fault modeling and design manufacturing.

Produktkennzeichnungen

ISBN-10
0792397142
ISBN-13
9780792397144
eBay Product ID (ePID)
64311056

Produkt Hauptmerkmale

Produktart
Lehrbuch
Sprache
Englisch
Anzahl der Seiten
172 Seiten
Verlag
Springer Us
Publikationsname
From Contamination to Defects, Faults And Yield Loss
Autor
Wojciech Maly
Format
Gebundene Ausgabe
Erscheinungsjahr
1996

Zusätzliche Produkteigenschaften

Hörbuch
No
Inhaltsbeschreibung
Hc Runder Rücken Kaschiert
Item Length
24cm
Item Height
1cm
Item Width
16cm
Nummer Innerhalb der Serie
5
Mitautor
Jitendra B. Khare
Item Weight
430g
Buchreihe
Frontiers in Electronic Testing

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From Contamination to Defects, Faults and Yield Loss von Wojciech Maly (1996, Gebundene Ausgabe)

About this product

Produktinformation

Produktkennzeichnungen

Produkt Hauptmerkmale

Zusätzliche Produkteigenschaften

Best Selling in Textbooks

Diagnostic and Statistical Manual of Mental Disorders DSM-5-TR by American Psychiatric Association (2022, Trade Paperback)

Desk Reference to the Diagnostic Criteria from DSM-5-TR by American Psychiatric Association (2022, Trade Paperback)

Self Heal by Design : The Role of Micro-organisms for Health by Barbara O'Neill (2018, Trade Paperback)

Leadership : Theory and Practice by Peter G. Northouse (2021, Trade Paperback, Revised edition)

Research Design : Qualitative, Quantitative, and Mixed Methods Approaches by J. David Creswell and John W. Creswell (2022, Trade Paperback)

Diagnostic and Statistical Manual of Mental Disorders : DSM-5-TR by American Psychiatric Association (2022, Hardcover)

Designing Data-Intensive Applications : The Big Ideas Behind Reliable, Scalable, and Maintainable Systems by Martin Kleppmann (2017, Trade Paperback)

Save on Textbooks

Diagnostic and Statistical Manual of Mental Disorders DSM-5-TR Brand new

Designing Data-Intensive Applications : The Big Ideas Behind Reliable.....

International Residential Code for One and Two-Family Dwellings 2021 free ship

National Electrical Code (NEC) NFPA 70 2020 Edition Spiral USA STOCK

Publication Manual of the American Psychological Association: 7th Edition, 2020

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